UFS

UFS Testing Service

Overview

Universal Flash Storage (UFS) is a high-performance embedded storage interface standard that is widely used in smartphones, tablets, automotive electronics, and other devices. With the development of new versions such as UFS 3.x and UFS 4.0, data transfer rates have reached the Gbps level, placing higher demands on signal integrity. Physical layer testing for UFS is a critical step to ensure system stability and data integrity, especially in high-speed transmission environments.

Common Devices Under Test

Products commonly tested for UFS physical layer signal integrity include:

Device	Properties
Smartphone SoCs (Application Processors)	To verify the high-speed data interfaces integrated into mobile chipsets.
UFS Controller Chips	To ensure the controller can manage data flow reliably at Gbps speeds.
UFS Storage Devices (UFS NAND)	To test the embedded flash memory components for stable performance.
Storage Modules (e.g., UFS Cards or BGA-packaged Modules)	To evaluate the integrity and compatibility of modular storage solutions.
UFS Interfaces in Automotive Infotainment Systems	To ensure reliable high-speed storage connections in in-vehicle entertainment and information systems.

UFS Test Standards

The main test standards for UFS physical layer testing include:

Standard	Properties
Electrical Characteristics	Such as voltage swing, signal levels, and impedance matching to ensure proper electrical performance.
Timing Parameters	Including data setup time, hold time, and clock skew to verify that timing requirements are met.
Signal Integrity	Tests like eye diagram quality, jitter, and crosstalk to assess the stability and quality of high-speed signals.
Environmental Requirements	Considering the effects of temperature, humidity, and power supply noise on signal performance and test results.

Common UFS Physical Layer Signal Integrity Test Items

Physical layer signal integrity testing for UFS covers several key test items, including but not limited to:

Eye Diagram
Jitter Measurement
Return Loss & Insertion Loss
Clock Recovery Test
Receiver Sensitivity Test
Transmitter Voltage Swing & Template Mask Test
SSC (Spread Spectrum Clocking) Test

Commonly Used Test Instruments

When performing UFS physical layer testing, the following instruments are typically used:

instrument	Properties
High-Speed Oscilloscope (e.g., Keysight Infiniium UXR series, Tektronix DPO/MSO series)	Used for eye diagram and jitter analysis to assess signal quality.
BERT (Bit Error Rate Tester)	Used for measuring bit error rates and testing receiver sensitivity under various stress conditions.
VNA (Vector Network Analyzer)	Used for insertion loss and return loss measurements to evaluate channel performance.
Protocol Analyzer	Used to validate upper-layer protocol interactions in coordination with physical layer tests, ensuring overall compliance and reliability.

UFS