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MIPI M-PHY Test Procedure and Practical GuideThe Biggest Contribution To Humanity.

I. Introduction

1. Overview of MIPI M-PHY Testing

MIPI M-PHY is a high-speed serial interface standard defined by the MIPI (Mobile Industry Processor Interface) Alliance.
It is mainly used in mobile devices, high-speed storage (such as UFS), high-performance computing (such as M-PCIe), camera, and display interfaces.
M-PHY adopts a layered architecture and supports multiple operating modes (such as High-Speed (HS) mode and low-power PWM mode), featuring high data transfer rates, low power consumption, and flexibility.

2. Main Aspects of MIPI M-PHY Testing

  • Signal Integrity Testing: Measuring parameters like eye diagram, jitter, rise/fall time, differential voltage, etc., to ensure signal quality.

  • Compliance Testing: Executing automated tests according to MIPI specifications to verify whether the DUT (Device Under Test) meets the standards.

  • Bit Error Rate (BER) Testing: Checking the BER during high-speed transmission to ensure data integrity.

  • Protocol Layer Testing: Verifying protocol operation for different applications (e.g., UFS, M-PCIe).

  • Reference Clock Testing: Checking the stability of the system clock to avoid data transmission errors.

3. MIPI M-PHY Gear Rates

MIPI M-PHY defines different data rates using “Gears”, mainly including:

GearData Rate (per lane)
Gear 11.46 Gbps
Gear 22.92 Gbps
Gear 35.83 Gbps
Gear 411.66 Gbps
Gear 523.32 Gbps (supported by the latest standard)
  • Low-Speed Mode (PWM-TX): Mainly for low-power communication, lower data rates.
  • High-Speed Mode (HS-TX): For high-bandwidth data transmission, higher data rates.

Testing at different speeds requires high-bandwidth oscilloscopes (such as the Keysight UXR series) and specialized probes to ensure measurement accuracy and signal integrity.


II. Overview of Device Under Test (DUT)

The DUT in this testing session is a storage device (such as a UFS chip) or a high-speed communication module (such as an M-PCIe device) that supports the MIPI M-PHY interface.


III. Testing Equipment Used

Keysight Infiniium series high-end oscilloscopes were used, specifically:

  • Keysight UXR-Series Oscilloscopes (13 GHz to 110 GHz)

Additionally, the Keysight D9040MPHC MIPI M-PHY Compliance Test Software was used to automate testing and generate reports.

Key Features of D9040MPHC:

  • Testing according to full MIPI M-PHY v4.1 and CTS v4.1 specifications.

  • Supports PWM and HS testing across all speed settings.

  • Automates oscilloscope setup, testing, and reporting to improve accuracy, save time, and enhance repeatability.

  • Performs automatic margin analysis.

1. Test Equipment Setup

Probes and Adapters:

  • MX0025A InfiniiMax Ultra 25 GHz Probe
  • N7010A 30 GHz Active Termination Adapter (for continuous mode testing)
  • SMA Cables (for connecting DUT to oscilloscope)

IV. Test Preparation and Connection

1. Hardware Connection Steps

  1. Place the DUT on the test platform and connect it to the MIPI M-PHY signal test points.

  2. Use the MX0025A probe to connect to the DUT’s TX output.

  3. Ensure the oscilloscope’s input channels are correctly mapped to the M-PHY signal lanes.

  4. Use the N7010A adapter to optimize signal integrity.

2. Accessories Setup

  1. Power on the Keysight Infiniium oscilloscope and launch the D9040MPHC MIPI M-PHY compliance test software.

  2. Select the test standard version (MIPI M-PHY v3.0/v4.0/v4.1).

  3. Set the data rate (Gear1 – Gear4, up to 11.66 Gbps).

  4. Configure triggering to correctly capture the DUT’s TX signals.


V. Test Items

1. High-Speed TX (HS-TX) Characteristic Testing

  • Test 1.1.1 UIHS and fOFFSET_TX

  • Test 1.1.2 PSDCM_TX (Reference Test)

  • Test 1.1.3 THS_PREPARE

  • Test 1.1.4 VCM_TX

  • Test 1.1.5 VDIF_DC_TX

  • Test 1.1.6 TEYE_TX, VDIF_AC_TX (Gear1 and Gear2)

  • Test 1.1.7 TEYE_HS_G3/G4_TX, VDIF_AC_HS_G3/G4_TX

  • Test 1.1.8 TR_HS_TX and TF_HS_TX (Reference Test)

  • Test 1.1.9 TL2L_SKEW_HS_TX (for devices supporting two or more lanes)

  • Test 1.1.10 SRDIF_TX [MIN/MAX] (Gear1 only)

  • Test 1.1.11 SR_DIF Monotonicity (Gear1 only)

  • Test 1.1.12 ΔSR_DIF_TX (Gear1 only)

  • Test 1.1.13 TINTRA_SKEW_TX

  • Test 1.1.14 TPULSE (Reference Test)

  • Test 1.1.15 TJTX (Reference Test)

  • Test 1.1.16 STTJTX (Reference Test)

  • Test 1.1.17 DJTX (Reference Test)

  • Test 1.1.18 STDJTX (Reference Test)

2. Low-Speed PWM-TX Characteristic Testing

  • Test 1.2.1 TPWM_TX

  • Test 1.2.2 kPWM_TX

  • Test 1.2.3 TPWM_PREPARE

  • Test 1.2.4 VCM_TX

  • Test 1.2.5 VDIF_DC

  • Test 1.2.6 TEYE_TX (Deprecated)

  • Test 1.2.7 VDIF_AC_TX

  • Test 1.2.8 TR_PWM_TX and TF_PWM_TX

  • Test 1.2.9 TL2L_SKEW_PWM_TX

  • Test 1.2.10 TOLPWM_G1_LR_TX

  • Test 1.2.11 TPWM_MINOR_G0_TX


VI. Generating Test Reports

Upon completion of the tests, the software automatically generates a report including:

  • Test pass/fail results
  • Detailed measurement data
  • Margin analysis
  • Eye diagram and waveform screenshots

Reports can be exported in PDF or CSV format for further analysis and archiving.


VII. Conclusion

MIPI M-PHY compliance testing is a crucial step in ensuring products meet industry standards and enhance product reliability.
Using the Keysight Infiniium oscilloscope and D9040MPHC software enables efficient execution of M-PHY tests and provides detailed analytical reports, offering critical references for product optimization.

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